Thermal transient spectroscopy (DLTS, PICTS, TSC)

Thermal transient spectroscopies are efficient and powerful methods used for observing and characterizing deep level impurities in semiconductors. The methods comprise DLTS (Deep Level transient Spectroscopy) PICTS (Photoinduced Current Spectroscopy) TSC (thermally Stimulated Capacitance).

Contacts

Daniela Cavalcoli

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