(iEntrance facility)
Thermal transient spectroscopies are efficient and powerful methods used for observing and characterizing deep level impurities in semiconductors. The methods comprise DLTS (Deep Level transient Spectroscopy) PICTS (Photoinduced Current Spectroscopy) TSC (thermally Stimulated Capacitance). The system is equipped with cryogenic (T>20K) and high vacuum laboratory facilities (Janis), temperature controllers (Lakeshore), voltage pulser, function generator, low noise current amplifier, LCZ meter (Keysight E4980AL), capacimeters (Boonton 1MHz,) and NI acquistition boards.