Dielectric spectroscopy is a non-destructive technique for the study of the response of a material subjected to an applied electric field at various frequencies.
Device: Novocontrol Alpha Dielectric analyzer for cables and flat specimens
Frequencies: 0.001 Hz up to 10 MHz
Temperatures: -100°C up to +200°C
Voltage: up to 2 kVp
This is a relaxation technique for investigation of molecular mobility in the solid state with sensitivity comparable to DMA.
Materials: semiconductors, polymers, polymer-clay composites.
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Operating principle: Thermal detrapping of carriers from defects causes peaks in the leakage current at certain temperatures corresponding to specific trapping centers.
Sensitivity: Densities of electronically active traps as low as 109 cm−3 can easily be detected in high resistivity materials.