The Challenges

In the BIP laboratory course, you will adress different challenges regarding Atomic Force Microscopy. Depending on your interest, you can select different challenges for example:

1. Imaging nanoscale roughness of functional oxide surfaces (imaging)
2. Functional imaging of thin-film transistors (imaging)
3. Visualizing yeast cells in action (imaging)
4. Observing photoelectric effects on solar cells at the nanoscale (imaging)
5. Probing the mechanical softness of epithelial cancer cells (imaging)
6. Visualizing complex 3D geometries with AFM (complementary)
7. Analyzing force–distance curves to extract elastic properties (complementary)
8. Determining cantilever parameters from thermal noise analysis (complementary)
9. Automating image analysis with scripts (complementary)
10. Filtering AC signals using a lock-in amplifier (complementary)
11. Monitoring AFM analog signals with an oscilloscope (complementary).