Nanoscale characterization

Powder X-ray Diffraction 

Malvern Panalytical Empyrean X-ray Diffractometer for powder and thin film analysis, equipped with XYZ stage for grazing incidence measurements and heating chamber for in-situ thermal studies

Scanning Electron Microscope

Scanning Electron Microscope Leica/Cambridge Stereoscan 360, equipped with Oxford Instruments EDS microanalysis, controlled by INCA Software.

Direct access to the a Zeiss Leo 1530 FE-SEM, located at CNR-ISMN Bologna, for high resolution imaging.

High Resolution Transmission Electron Microscopy (TEM)

We have direct access to the Electron Microscopy Lab, located in the nearby CNR-ISMN institute, equipped with:

• 300kV Double Cs-corrected S/TEM for atomic resolution imaging, equipped with EDS/EELS spectrometers
• 200kV FEG HRTEM equipped with EDS/EELS spectrometers and Protochips Fusion/Poseidon holders for in-situ TEM
• 200kV FEG TEM for sample screening and instrument development